MSE 225

Materials Science and Engineering 225
Xray Crystallography and Spectrography

Course Description
X-ray methods for the characterization of crystal structure and determination of chemical composition

Course Outline

  1. Properties of X-rays
  2. Geometry of Crystals
  3. Diffraction I: Directions of Diffracted Beams
  4. Diffraction II: Intensities of Diffracted Beams
  5. Diffraction III: Non-Ideal Samples
  6. Laue Photographs
  7. Powder Photographs
  8. Diffractometer and Spectrometer
  9. Orientation and Quality of Single Crystals
  10. Structure of Polycrystalline Aggregates
  11. Determination of Crystal Structure
  12. Precise Parameter Measurements
  13. Phase-Diagram Determination
  14. Order-Disorder Transformation (optional)
  15. Chemical Analysis of X-ray Diffraction (optional)
  16. Chemical Analysis by X-ray Spectrometry (optional)
  17. Measurements of Residual Stress

References

  1. C. Hammond, The Basics of Crystallography and Diffraction Second Edition
  2. B E Warren, X-Ray Diffraction
  3. Frank H Chung, Deane K Smith, Industrial Applications of X-Ray Diffraction
  4. Andre Guinier, X-Ray Diffraction: In Crystals, Imperfect Crystals, and Amorphous Bodies